Reliability of portable devices becomes a serious issue as complexity of the devices grows and miniaturization trend continues. In case of dynamic applications durability against impact on hard surfaces is a standard requirement for mobile electronic devices, verified in drop tests. Computer Aided Engineering (CAE) methods and tools are used as means to accelerate the overall design cycle and to reduce time to market. In case of drop test simulations it is an important task to assess quality of simulation models and effect of different input parameters on results. This paper describes first results of a research project on development of an automated procedure of sensitivity analysis and robustness evaluation of product level simulation models used for drop test simulation.
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