An automated framework for numerical simulation is developed to estimate the probability of brittle failure for a cell-phone display subjected to accelerated life cycle testing (ALT). SIMULIA Isight and the Abaqus-Python interface are used to predict the field-failure rate (FFR). The framework’s adaptable definition of inputs and output parameters can be extended to other common failures in handheld devices such as the denting and cracking of the housing walls, the cracking and delamination of the solder-joints in surface mounted devices, and the shock based criteria for packaged components.
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