IdEM

ELECTRONIC DEVICE CHARACTERIZATION

IdEM - SIMULIA by Dassault Systèmes®

IdEM is a user-friendly tool for the generation of macromodels of linear lumped multi-port structures (via fields, connectors, packages, discontinuities, etc.), known from their input-output port responses. The raw characterization of the structure can come from measurement or simulation, either in frequency domain or in time domain. A suite of advanced and well-conditioned rational fitting modules grants applicability to virtually any kind of characterization. The resulting models are cast in common SPICE formats for the system-level simulations required in your design flow. Thus, IdEM enables SPICE model extraction and processing for any kind of linear structure, component, interconnect, package, whatever your native characterization and application area.

IdEM is an optional part of CST Studio Suite® and is also available as a stand-alone offering.

Why IdEM

IdEM uses best-in-class algorithms to build macromodels, including a proprietary data causality certification module based on Hilbert transform, highly scalable rational fitting modules enabling unlimited port counts, and top-class passivity enforcement schemes for safe and stable transient simulations. Thanks to the multiprocessing module, IdEM enables efficient macromodeling of ever-larger structures

About IdEM

Fully-developed GUI: all algorithms of IdEM are linked to an intuitive Graphical User Interface

Easy to use: little expert knowledge is needed for using most algorithms with standard settings

Flexible and powerful: a rich set of control parameters is available for advanced users

Accurate and efficient: IdEM uses state-of-the-art fitting algorithms for rational approximations with guaranteed passivity

Unlimited ports: splitting strategies are adopted for handling large port counts without excessive memory requirements

Data import: import filters are available for Touchstone and other common data formats

Model export: models can be synthesized as equivalent circuits into common SPICE formats

Best-in-class features

Causality: A proprietary causality check module enables the detection of possible measurement/simulation errors that compromise the physical consistency of the raw data.

Passivity: Top-class algorithms are available for model passivity enforcement, ensuring safe use of models in system-level EMC/SI/PI simulations.

Multiprocessing: An advanced module enables multi-thread capabilities, with an extraordinary speed-up in simulation time and guaranteeing an efficient macromodeling of ever-larger structures.